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Material Characterization
X-Ray Diffraction (XRD)

PE has laboratory facilities with X-ray Diffraction (XRD) instrumentation. PE uses XRD to identify crystalline materials for materials characterization.

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SEM/EDX

PE has laboratory facilities with Scanning Electron Microscopy (SEM), including Energy Dispersive X-ray (EDX) analytical capabilities. The SEM is used for high magnification, high resolution microscopy. The EDX is utilized to identify atomic elements and relative concentrations of elements in material samples.

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FTIR

PE has laboratory facilities with Fourier Transform Infra-red Spectroscopy (FTIR). FTIR is used to identify the chemical bonds in unknown compounds, especially for liquids and plastics.

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Chromatography

PE has laboratory facilities with chromatography instruments for materials characterization.

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Spectroscopy

PE has laboratory facilities with spectroscopy instruments for materials characterization.

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Optical Microscopy

PE has laboratory facilities with optical microscopy instruments, including polarized light sources. The microscopes are equipped with digital and photographic cameras for documentation of the observed structures.

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